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  • Services
    Services

    Engaging Eltron can help speed time to market and reduce risks associated with introducing new technology. In essence, our Ph.D. scientists and engineers are an "instant R&D" team that's ready to complement your in-house staff and help you adjust to industry trends.

  • Services
    Services

    Engaging Eltron can help speed time to market and reduce risks associated with introducing new technology. In essence, our Ph.D. scientists and engineers are an "instant R&D" team that's ready to complement your in-house staff and help you adjust to industry trends.

SEM (Scanning Electron Microscope) & EDX (Energy Dispersive X-Ray) Services

Eltron Research & Development is pleased to offer SEM/EDX Sample Processing Services. We provide quality materials characterization for a wide rande of samples.

Scope of Service:

  • • SEM, EDX, and analySISTM software, operated by an Eltron technician
  • • 1280x 960 pixel x 8 bit resolution digital pictures on CD-ROM
  • • Hard Copy report with measurements, spectrum annotation and elemental identification information

• SEM and EDX Rental includes the following:

  • • Surface, cross-section, fracture and fiber topography
  • • Grain and particle size measurement
  • • High magnification up to 100,000
  • • X-ray analysis spectrum and identification
  • • Line profile analysis between any two defined points
  • • Spotlight mode to identify points on image and collect spectra from those points
  • • Elemental mapping and coloring of present phases
  • • Second Phase, porosity, surface area, and thickness measurements

• Material examples:

  • • Electrochemical and catalysis related membranes
  • • Ceramics, metals, composites, glasses and polymers
  • • Mounted micron and nanoparticle powders
  • • Metal films
Elemental mapping, line profile analysis and other X-Ray microanalysis tools are available

Performance Specs:

  • • Mangnification: X18 - 300,000 (with conductive sample prep)
  • • SEI / Si-Li EDX Detection
  • • Phase Analysis, Surface Area and Thickness Measurements
  • • 0.5 - 30 kV
  • • X-ray Elemental Mapping, Spot and Line Profile Analysis
  • • Digital Images and Maps in CD-ROM Format
SEM Image of Ceramic Whiskers within a Metals Interface
SEM Image of a MEMS-based structure fabricated using silicon micromachining methods combined with electrochemical metal depositions

Eltron's Contract R&D Services can be reached at (303) 530-0263 or business@eltronresearch.com